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Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.

This second edition of Scanning Tunneling Microscopy I, updated with a guide to recent literature, is a unique introduction into a novel and fascinating technique that produces beautiful images of nature on an atomic scale, offering a comprehensive treatment of scanning tunneling microscopy, its diverse applications and its theoretical treatment. The present volume describes in detail the technique itself, its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original works will help to make accessible the vast body of knowledge already accumulated in this field.

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

The two-volume Advances in Information Systems Development: Bridging the Gap between Academia and Industry constitutes the collected proceedings of the Fourteenth International Conference on Information Systems Development: Methods and Tools, Theory and Practice – ISD’2005 Conference. The focus of these volumes is to examine the exchange of ideas between academia and industry and aims to explore new solutions. The proceedings follow the seven conference tracks highlighted at the Conference: Co-design of Business and IT; Communication and Methods; Human Values of Information Technology; Service Development and IT; Requirements Engineering in the IS Life-Cycle; Semantic Web Approaches and Applications; and Management and IT.

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.