Trace Characterization, Chemical and Physical

A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).