Closely follows an actual structural determination. After some introductory material on the nature of x-rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring raw x-ray data are covered, plus their reduction into a useable form. The second part discusses both traditional and novel methods of solving the ``phase'' problem, the principal difficulty in x-ray structure determination. The third part considers how to extract the most information from the data and how to evaluate its reliability. Finally, there is a discussion of sources of error in practice and interpretation.
Book Details
- Country: US
- Published: 1989-05-08
- Publisher: John Wiley & Sons
- Language: English
- Pages: 480
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